Research2026-04-30
SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection
Source: Arxiv CS.AI
arXiv:2604.26633v1 Announce Type: cross Abstract: The bottleneck in learning-based industrial defect detection is often limited not by model capacity, but by the scarcity of labeled defect data: defects are rare, annotations are expensive, and collecting balanced training sets is slow. We present...
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